- Abrasion wear resistance tests
- Wear rate tests
- Coating thickness tests
- Arbor for balls and pins with diameters: 1.5; 3; 6 and 10mm
- Loads: 0.25N, 0.5N, 1N, 2N, 5N, 10N, 20N, 30N, 60N
- Maximum test length 40 days
- Indentation device
- In situ compression test
- Bending test “in situ”
- Scratch test “in situ”
- Nano-hardness measurement “in situ”
Tescan Vega 4 GMU scanning electron microscope with Oxford Instruments Explore EDS analyser
The scanning electron microscope allows analysis of surface topography and morphology with simultaneous elemental microanalysis.
The use of a variable vacuum allows observations to be made on poorly conducting specimens. The large working chamber allows work with large samples without the need for cutting.
Features include:
– Tungsten emitter
– SE and BSE detector
– Variable vacuum operation
– Large working chamber
– EDS analyser
– Max. magnification of 500,000x
